DocumentCode :
1989246
Title :
Identification for integrating processes in the frequency domain
Author :
Wang, Ya-gang ; Cai, Wen-Jim
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
4
fYear :
2002
fDate :
2002
Firstpage :
3344
Abstract :
In this paper, a new identification method in the frequency domain from a relay-based test is proposed for integrating processes. In the relay test, only the very first period of oscillating input is implemented, which automatically results in a two-side pulse signal. The two-side pulse waveform contains enough larger spectrum magnitude over the important frequency range so that the process frequency responses can be accurately estimated at multiple points using the Fourier analysis method. Simulation examples are given to show both the effectiveness and practicality of the identification method for various integrating processes.
Keywords :
Fourier analysis; closed loop systems; feedback; frequency response; frequency-domain analysis; identification; relay control; Fourier analysis; frequency domain; frequency responses; identification; oscillating input; relay feedback system; two-side pulse signal; Automatic testing; Chemical engineering; Electronic equipment testing; Feedback; Frequency domain analysis; Frequency estimation; Frequency response; Function approximation; Relays; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2002. Proceedings of the 4th World Congress on
Print_ISBN :
0-7803-7268-9
Type :
conf
DOI :
10.1109/WCICA.2002.1020153
Filename :
1020153
Link To Document :
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