DocumentCode :
1989589
Title :
A study of the frequency stability limits of oscillators based on sapphire dielectric resonators
Author :
Hartnett, J.G. ; Ivanov, E.N. ; Tobar, M.E.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
1150
Abstract :
A novel approach to the design of ultra-stable microwave oscillators is presented. The method allows the short to medium term frequency stability to be accurately predicted a priori even before the beginning of the construction stage. This is achieved by characterising the fluctuations in various components and control systems of the oscillator in terms of their Allan variances. Stability limits are then determined by combining these results with the known Q-factors and frequency-temperature characteristics for both room temperature and cryogenic temperature compensated sapphire dielectric resonators
Keywords :
Q-factor; compensation; dielectric resonator oscillators; frequency stability; microwave oscillators; sapphire; Al2O3; Allan variances; Q-factors; frequency stability limits; frequency-temperature characteristics; sapphire dielectric resonators; temperature compensated circuits; ultra-stable microwave oscillators; Circuit noise; Detectors; Dielectrics; Fluctuations; Frequency conversion; Microwave amplifiers; Noise figure; Oscillators; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
ISSN :
1075-6787
Print_ISBN :
0-7803-5400-1
Type :
conf
DOI :
10.1109/FREQ.1999.841544
Filename :
841544
Link To Document :
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