DocumentCode
1989785
Title
Double-layer no-flow underfill materials and process
Author
Zhang, Zhuqing ; Wong, C.P.
Author_Institution
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2002
fDate
2002
Firstpage
84
Lastpage
91
Abstract
No-flow underfill has been invented and practiced in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. CSP components are assembled using the double-layer no-flow underfill process. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. With high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation.
Keywords
adhesives; chip scale packaging; design of experiments; filled polymers; flip-chip devices; reflow soldering; thermal expansion; thermal management (packaging); wetting; CSP components; DSC; bottom layer underfill thickness; bottom layer underfill viscosity; curing behavior; design of experiment; double-layer no-flow underfill; fillers incorporation; flip-chip process; package reliability; quartz chips; reflow profile; silica fillers; solder wetting properties; thermal expansion coefficient; Assembly; Curing; Electromagnetic compatibility; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Polymers and Adhesives in Microelectronics and Photonics, 2002. POLYTRONIC 2002. 2nd International IEEE Conference on
Print_ISBN
0-7803-7567-X
Type
conf
DOI
10.1109/POLYTR.2002.1020188
Filename
1020188
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