DocumentCode
1990032
Title
A Novel Waveguide Transistor Noise Measurement System
Author
Ebner, H. ; Opfer, J.
Author_Institution
Institut fÿr Hochfrequenztechnik, RWTH Aachen, Aachen, Germany
fYear
1984
fDate
10-13 Sept. 1984
Firstpage
451
Lastpage
456
Abstract
An accurate, semi-automatic transistor noise measurement scheme for mm-wave applications is presented. The method is based on the determination of the transistor noise equivalent circuit parameters by regression techniques.
Keywords
Acoustic reflection; Application software; Circuit noise; Computer errors; Equivalent circuits; Fluctuations; Matrices; Noise generators; Noise measurement; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1984. 14th European
Conference_Location
Liege, Belgium
Type
conf
DOI
10.1109/EUMA.1984.333356
Filename
4132074
Link To Document