• DocumentCode
    1990381
  • Title

    Reliability study for high temperature stable conductive adhesives

  • Author

    Tao, Wenkai ; Chen, Si ; Berggren, Par ; Liu, Johan

  • Author_Institution
    Key State Lab. of New Displays & Syst. Applic., Shanghai Univ., Shanghai, China
  • fYear
    2010
  • fDate
    Feb. 28 2010-March 2 2010
  • Firstpage
    74
  • Lastpage
    77
  • Abstract
    With fast development of electronic packaging, the conductive adhesives were widely used in surface mount and chip interconnection. As an alternative to solder, it has many advantages, such as low processing temperature, less environment contamination and fine pitch capability. However, conductive adhesive joining technology also simultaneously faces a lot of challenges. The major problem of current conductive adhesives is easy to degrade during temperature and humidity aging. Therefore a high temperature stable matrix was developed for conductive adhesive fabrication. Based on this matrix, a kind of isotropic conductive adhesive (ICA) was fabricated in this work. The curing behavior of ICA was investigated by Differential Scanning Calorimeter (DSC). The properties such as glass transition temperature (Tg), storage modulus were detected by Dynamic Mechanical Analyzer (DMA). Thermogravimetric Analysis (TGA) was used to determine the decomposition behavior. The humidity test was subsequently carried out to evaluate moisture resistance of ICA. The electrical resistances of the ICA samples were measured by the multimeter. During humidity test, no obvious change of electrical resistance of ICA samples was observed.
  • Keywords
    conductive adhesives; curing; differential scanning calorimetry; electronics packaging; fine-pitch technology; joining processes; reliability; chip interconnection; curing behavior; decomposition behavior; differential scanning calorimeter; dynamic mechanical analyzer; electrical resistance; electronic packaging; environment contamination; fine pitch capability; glass transition temperature; high temperature stable conductive adhesives; high temperature stable matrix; humidity aging; humidity test; isotropic conductive adhesive; joining technology; low processing temperature; moisture resistance; reliability; storage modulus; surface mount; temperature aging; thermogravimetric analysis; Aging; Conductive adhesives; Degradation; Electric resistance; Electronics packaging; Humidity; Independent component analysis; Surface contamination; Temperature; Testing; contact resistance; humidity; isotropic conductive adhesives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Microtech, 2010. APM '10. International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-6756-3
  • Type

    conf

  • DOI
    10.1109/ISAPM.2010.5441378
  • Filename
    5441378