Title :
Advanced automatic test pattern generation and redundancy identification techniques
Author :
Schulz, M.H. ; Auth, E.
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Munich, West Germany
Abstract :
Based on the sophisticated strategies used in the automatic test pattern generation system SOCRATES, the authors present several concepts aiming at a further improvement and acceleration of the deterministic test pattern generation and redundancy identification process. In particular, they describe an improved implication procedure and an improved unique sensitization procedure. Both procedures significantly advance the deterministic test pattern generation and redundancy identification especially for those faults, for which it is difficult to generate a test pattern or to prove them to be redundant, respectively. As a result of the application of the proposed techniques, SOCRATES is capable of successfully generating a test pattern for all testable faults in a set of combinational benchmark circuits, and of identifying all redundant faults with less than 10 backtrackings.<>
Keywords :
automatic testing; combinatorial circuits; logic testing; redundancy; SOCRATES; automatic test pattern generation; combinational benchmark circuits; deterministic test pattern generation; redundancy; redundancy identification; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Life estimation; Redundancy; Test pattern generators; Very large scale integration;
Conference_Titel :
Fault-Tolerant Computing, 1988. FTCS-18, Digest of Papers., Eighteenth International Symposium on
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-8186-0867-6
DOI :
10.1109/FTCS.1988.5293