Title :
New sensitivity normalization in electrical tomography
Author :
Wang, Zhanjun ; Li, Liu
Author_Institution :
Dept. of Comput. & Math. Teaching, Shenyang Normal Univ., Shenyang, China
Abstract :
Due to the shortcoming of linear normalization for sensitivity in electrical tomography system, nonlinear formulas are derived about electrical resistance tomography (ERT), capacitance tomography (ECT) and electromagnetic tomography (EMT). Those formulas are deduced according to the characteristics of analytical solution and system structure. The role of normalization in data processing is introduced. Logarithmic normalization formula is summarized for ERT. In ECT, parallel model and serial model are introduced, and nonlinear formulas are described depending on real distribution in object field. Mainly, special normalization formula is deduced.
Keywords :
computerised tomography; capacitance tomography; data processing; electrical resistance tomography; electromagnetic tomography; linear normalization; logarithmic normalization formula; object field; real distribution; sensitivity normalization; Capacitance; Educational institutions; Electrical capacitance tomography; Instruments; Sensitivity; electrical tomography; normalization; sensitivity;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8162-0
DOI :
10.1109/ICECENG.2011.6057872
