DocumentCode
1991382
Title
Evaluation of elastic inhomogeneity in ZnO crystal by means of the micro-LFB ultrasonic material Characterization System
Author
Kushibiki, Jun-ichi ; Ohashi, Yuji ; Arakawa, Mototaka ; Yoshida, Sho ; Sakagami, Noboru
Author_Institution
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear
2009
fDate
20-23 Sept. 2009
Firstpage
799
Lastpage
802
Abstract
In this paper, we tried to evaluate several small ZnO single crystals grown by the hydrothermal method using a microline- focus-beam ultrasonic material characterization (LFB-UMC) system. We measured leaky surface-acoustic-wave (LSAW) velocity distributions at 225 MHz for the top and bottom surfaces of three (100) (Y-cut) ZnO specimens with different colors, i.e. different electrical properties. We prepared a standard specimen of YX-ZnO, proper for calibrating the LFB system, which is independent of the piezoelectricity of ZnO. We evaluated the Ycut specimen surfaces using the piezo-active Z-axis LSAW propagation, resulting in a high velocity of 2649 m/s for a very resistive (>100 ¿ m) surface and a very low velocity of 2618 m/s for a very conductive (<1 ¿ m) surface. Additional experiments for cross-sectional ±c-plane surfaces of one Y-cut ZnO specimen plate revealed significant LSAW velocity distributions associated with the crystal growth condition changes. This ultrasonic method will be useful for further understanding the crystal growth processes.
Keywords
II-VI semiconductors; elasticity; surface acoustic waves; surface conductivity; surface resistance; ultrasonic materials testing; wide band gap semiconductors; zinc compounds; ZnO; cross-sectional ±c-plane surface; elastic inhomogeneity; frequency 225 MHz; hydrothermal method; leaky surface-acoustic-wave velocity distribution; microLFB ultrasonic material characterization; microline-focus-beam ultrasonic material characterization; piezo-active Z-axis LSAW propagation; single crystal growth; standard specimen; surface conductivity; surface resistivity; Acoustic noise; Acoustic propagation; Acoustic pulses; Acoustic reflection; Crystalline materials; Degradation; Frequency; Image quality; Ultrasonic imaging; Zinc oxide; ZnO single crystal; leaky surface acoustic wave velocity; micro-LFB ultrasonic device; resistivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location
Rome
ISSN
1948-5719
Print_ISBN
978-1-4244-4389-5
Electronic_ISBN
1948-5719
Type
conf
DOI
10.1109/ULTSYM.2009.5441424
Filename
5441424
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