Title :
Evaluation of elastic inhomogeneity in ZnO crystal by means of the micro-LFB ultrasonic material Characterization System
Author :
Kushibiki, Jun-ichi ; Ohashi, Yuji ; Arakawa, Mototaka ; Yoshida, Sho ; Sakagami, Noboru
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
Abstract :
In this paper, we tried to evaluate several small ZnO single crystals grown by the hydrothermal method using a microline- focus-beam ultrasonic material characterization (LFB-UMC) system. We measured leaky surface-acoustic-wave (LSAW) velocity distributions at 225 MHz for the top and bottom surfaces of three (100) (Y-cut) ZnO specimens with different colors, i.e. different electrical properties. We prepared a standard specimen of YX-ZnO, proper for calibrating the LFB system, which is independent of the piezoelectricity of ZnO. We evaluated the Ycut specimen surfaces using the piezo-active Z-axis LSAW propagation, resulting in a high velocity of 2649 m/s for a very resistive (>100 ¿ m) surface and a very low velocity of 2618 m/s for a very conductive (<1 ¿ m) surface. Additional experiments for cross-sectional ±c-plane surfaces of one Y-cut ZnO specimen plate revealed significant LSAW velocity distributions associated with the crystal growth condition changes. This ultrasonic method will be useful for further understanding the crystal growth processes.
Keywords :
II-VI semiconductors; elasticity; surface acoustic waves; surface conductivity; surface resistance; ultrasonic materials testing; wide band gap semiconductors; zinc compounds; ZnO; cross-sectional ±c-plane surface; elastic inhomogeneity; frequency 225 MHz; hydrothermal method; leaky surface-acoustic-wave velocity distribution; microLFB ultrasonic material characterization; microline-focus-beam ultrasonic material characterization; piezo-active Z-axis LSAW propagation; single crystal growth; standard specimen; surface conductivity; surface resistivity; Acoustic noise; Acoustic propagation; Acoustic pulses; Acoustic reflection; Crystalline materials; Degradation; Frequency; Image quality; Ultrasonic imaging; Zinc oxide; ZnO single crystal; leaky surface acoustic wave velocity; micro-LFB ultrasonic device; resistivity;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441424