DocumentCode :
1991496
Title :
Application of Near Infrared Spectroscopy in Quality Control of Paecilomyces Tenuipes
Author :
Song, Jia ; Du, Lin-na ; Yang, Shuang ; Lu, Jia-hui ; Meng, Qing-fan ; Teng, Li-rong
Author_Institution :
Coll. of Life Sci., Jilin Univ., Changchun, China
fYear :
2012
fDate :
27-30 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
Near infrared reflectance spectroscopy was used to quantify the cordycepic acid and adenosine content in Paecilomyces tenuipes mycelia. Quantification of cordycepic acid and adenosine content was achieved by the conventional method. Models were built using near infrared reflectance for determinating the contents of cordycepic acid and adenosine. Monte Carlo partial least square (MCPLS) and Moving window partial least square (MWPLS) was applied to optimize the models. Finally, the optimum models for determination of cordycepic acid and adenosine contents in Paecilomyces tenuipes powder samples. The correlation between actual and predictive values of calibration samples (Rc) were 0.8851 and 0.9185, the root mean square error of prediction set (RMSEP) were 16.6171 and 0.5949, the root mean square error of calibration set RMSEC were 15.5724 and 0.5844, respectively. These results demonstrate that the robustness, fit and predictive capability of these models were satisfied. This method should be popular in determination the key parameters during fermentation processes.
Keywords :
Monte Carlo methods; biotechnology; fermentation; infrared spectra; least squares approximations; mean square error methods; microorganisms; quality control; MCPLS; MWPLS; Monte Carlo partial least square; Paecilomyces tenuipes mycelia; RMSEC; RMSEP; adenosine content; cordycepic acid; fermentation process; moving window partial least square; near infrared reflectance; near infrared spectroscopy; quality control; root mean square error-of-calibration set; root mean square error-of-prediction set; Analytical models; Calibration; Powders; Predictive models; Reflectivity; Spectroscopy; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering and Technology (S-CET), 2012 Spring Congress on
Conference_Location :
Xian
Print_ISBN :
978-1-4577-1965-3
Type :
conf
DOI :
10.1109/SCET.2012.6342075
Filename :
6342075
Link To Document :
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