DocumentCode :
1991538
Title :
Land-Based Scatterometer Measurements and Retrieval of Surface Parameters Using Neural Networks
Author :
Jia Mingquan ; Chen Yan ; Tong Ling ; Liu Zengcan ; Xu Chunliang ; Lu Haiping
Author_Institution :
Inst. of Autom., Univ. of Electron. Sci. & Technol. of China, Chengdu
Volume :
2
fYear :
2008
fDate :
21-22 Dec. 2008
Firstpage :
448
Lastpage :
452
Abstract :
In this study, a multi-band FM-CW land- based scatterometer is used to measure the backscattering coefficient of bare soil surface. And then combined with the neural network which can be simulated in any nonlinear problem in theory, and integrated equation model (IEM) which has a wide range of surface roughness, has realized all of the surface parameters inversion through the theoretical simulation and the experimental data, including dielectric constant, surface rms high and correlation length. The results have a better consistency with the actual measurement parameters, and the difference among different angles inversion results reflects the uneven characteristics of reality surface. Final shows that retrieval of multi-parameter using neural networks to be effective, at the same time that simultaneous measurement of backscattering coefficient and surface parameter is a effective means that study features of microwave scattering.
Keywords :
atmospheric electromagnetic wave propagation; electromagnetic wave scattering; geophysics computing; microwave imaging; microwave measurement; neural nets; backscattering coefficient; dielectric constant; integrated equation model; land-based scatterometer measurements; microwave scattering; neural networks; surface parameters retrieval; surface roughness; Backscatter; Dielectric constant; Dielectric measurements; Microwave measurements; Neural networks; Nonlinear equations; Radar measurements; Rough surfaces; Soil measurements; Surface roughness; IEM; Scatterometer; dielectric constant; neural network; roughness; soil moisture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3563-0
Type :
conf
DOI :
10.1109/ETTandGRS.2008.85
Filename :
5070401
Link To Document :
بازگشت