Title :
Follow-up multicenter alpha counting comparison
Author :
Wilkinson, J.D. ; Clark, B.M. ; Wong, Rita ; Slayman, C. ; Gordon, Michael S. ; He, Yuhong ; Marckmann, J. ; McNally, B.D. ; Wu, Tsai-Fu
Abstract :
A follow-up alpha emissivity study was conducted to examine the wide variability observed in previous work that was hypothesized to be due to differences in the pulse height discrimination threshold among participant´s equipment. Two samples, one mixed energy and one monoenergetic, were prepared and sequentially circulated to all participants for counting. Analysis of the data demonstrates that only a small portion of the variability is explained by this mechanism. The role of the sample to entrance window gap for some counters was analyzed post hoc using the same data set and may be responsible for a large amount of the variability. The results of this large scale study demonstrate the continuing uncertainty for these measurements and the importance of interpreting their results appropriately when estimating soft error rates.
Keywords :
alpha-particle effects; radiation hardening (electronics); semiconductor device reliability; semiconductor device testing; alpha emissivity study; mixed energy; monoenergetic; multicenter alpha counting comparison; pulse height discrimination threshold; soft error rates; window gap; Alpha particles; Atmospheric measurements; Materials; Measurement uncertainty; Particle measurements; Radiation detectors; Uncertainty; Reliability; alpha particle; detectors; materials; single event upsets;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937355