Title :
On microprocessor error behavior modeling
Author :
Rimen, M. ; Ohlsson, J. ; Torin, J.
Author_Institution :
Lab. for Dependable Computing, Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
A microprocessor error behavior function (EBF) is introduced, mapping faults into errors on the functional level. The errors are obtained using a functional model of the processor. By applying the EBF to a fault and instruction distribution, it is possible to obtain the corresponding error distribution. A case study is described, in which (i) the EBFs for simulated bit-flip and pin-level faults are designed and used to compare the bit-flip and pin-level fault models, and (ii) the obtained error distribution for the bit-flip faults is used in an error injection experiment on the functional level to emulate these faults. For the processor used in the case study, it was found that only 9-12% of the bit-flip faults could be emulated using pin-level faults, while a tentative evaluation of the possibility to emulate bit-flip faults with software-implemented fault injection showed that 98-99% could be emulated. Finally, the results of the emulated bit-flip errors corresponded well to the real results obtained using bit-flip faults, thus indicating that the injected errors are good approximations of the faults.<>
Keywords :
computer testing; fault location; integrated circuit testing; microprocessor chips; bit-flip errors; bit-flip faults; error distribution; instruction distribution; microprocessor error behavior modeling; pin-level faults; Application software; Circuit faults; Computational modeling; Computer errors; Computer simulation; Fault detection; Fault tolerant systems; Laboratories; Microprocessors; Process design;
Conference_Titel :
Fault-Tolerant Computing, 1994. FTCS-24. Digest of Papers., Twenty-Fourth International Symposium on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-5520-8
DOI :
10.1109/FTCS.1994.315655