Title :
Scrutinizing graphene with polarized Raman spectroscopy
Author :
Huang, Cheng-Wen ; Liu, Chih-Yi ; Shiue, Ren-Jye ; Wang, Wei-Hua ; Wang, Juen-Kai ; Chui, Hsiang-Chen
Author_Institution :
Inst. of Electro-Opt. Sci. & Eng., Nat. Cheng Rung Univ., Tainan, Taiwan
fDate :
Aug. 28 2011-Sept. 1 2011
Abstract :
The authors report polarized Raman measurement of single-layer graphene. The G peak position shows polarization dependence, because of the stress on the sample. The relation between the local stress and the polarization will be discussed.
Keywords :
Raman spectroscopy; graphene; polarized Raman measurement; polarized Raman spectroscopy; single-layer graphene; Educational institutions; Measurement by laser beam; Optical films; Optical imaging; Optical polarization; Raman scattering; Strain;
Conference_Titel :
Quantum Electronics Conference & Lasers and Electro-Optics (CLEO/IQEC/PACIFIC RIM), 2011
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4577-1939-4
DOI :
10.1109/IQEC-CLEO.2011.6194033
