Title :
Single event transients of scan flip-flop and an SET-immune redundant delay filter (RDF)
Author :
Xinyuan Zhao ; Liang Wang ; Suge Yue
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing, China
Abstract :
Heavy-ion tests on 65nm CMOS Flip-Flops with different topologies are conducted to investigate their susceptibility to single event upsets (SEUs) and single event transients (SETs). The test results show that SETs on scan-enable node (SE) may cause a large number of SEUs, and the conventional delay filter is vulnerable to SETs, which can reduce the efficiency of delay-filter Flip-Flops. A new delay filter named redundant delay filter (RDF) is proposed to improve the SET immunity.
Keywords :
CMOS logic circuits; filters; flip-flops; integrated circuit testing; ion beam effects; logic testing; radiation hardening (electronics); transients; CMOS flip-flops; SET immunity; SET-immune redundant delay filter; heavy ion tests; scan enable node; scan flip-flop; single event transients; single event upset; size 65 nm; CMOS integrated circuits; Delays; Flip-flops; Resource description framework; Silicon; Single event transients; Single event upsets; Delay Filter; Heavy Ion test; SET; scan Flip-Flop;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937385
