• DocumentCode
    1992301
  • Title

    Compendium of SEE comparative results under ion and laser irradiation

  • Author

    Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Savchenkov, Dmitriy V. ; Yanenko, Andrey V. ; Kessarinskiy, Leonid N. ; Nekrasov, Pavel V. ; Sogoyan, Armen V. ; Tararaksin, Alexander I. ; Vasil´ev, Alexey L. ; Anashin, Vasily S. ; Chubunov, Pavel A.

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Compendium of SEU, SEL, SET, SEB and SEGR comparative results under ion irradiation and focused laser beam are presented. The possible sources of discrepancies between ion and laser results and the ways of data correction are discussed.
  • Keywords
    focused ion beam technology; laser beam applications; radiation hardening (electronics); SEB; SEGR; SEL; SET; SEU; compendium; data correction; focused laser beam irradiation; ion irradiation; ion results; laser results; Correlation coefficient; Ion beams; Ions; Laser beams; Radiation effects; Semiconductor lasers; SEB; SEGR; SEL; SET; SEU; heavy ions; laser;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937390
  • Filename
    6937390