Title :
Compendium of SEE comparative results under ion and laser irradiation
Author :
Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Savchenkov, Dmitriy V. ; Yanenko, Andrey V. ; Kessarinskiy, Leonid N. ; Nekrasov, Pavel V. ; Sogoyan, Armen V. ; Tararaksin, Alexander I. ; Vasil´ev, Alexey L. ; Anashin, Vasily S. ; Chubunov, Pavel A.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
Compendium of SEU, SEL, SET, SEB and SEGR comparative results under ion irradiation and focused laser beam are presented. The possible sources of discrepancies between ion and laser results and the ways of data correction are discussed.
Keywords :
focused ion beam technology; laser beam applications; radiation hardening (electronics); SEB; SEGR; SEL; SET; SEU; compendium; data correction; focused laser beam irradiation; ion irradiation; ion results; laser results; Correlation coefficient; Ion beams; Ions; Laser beams; Radiation effects; Semiconductor lasers; SEB; SEGR; SEL; SET; SEU; heavy ions; laser;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937390
