• DocumentCode
    1992379
  • Title

    Total dose and single event effects testing of the Intersil ISL70003SEH integrated point of load converter

  • Author

    van Vonno, N.W. ; White, J.D. ; Hood, R.A. ; Reingraber, M.A. ; Pearce, L.G. ; Thomson, E.J.

  • Author_Institution
    Precision Products, Intersil Corp., Palm Bay, FL, USA
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    We report results of destructive and nondestructive SEE testing and total dose testing of the ISL70003SEH integrated point of load (POL) converter, together with a discussion of the part´s electrical specifications and fabrication process.
  • Keywords
    convertors; power MOSFET; radiation hardening (electronics); ISL70003SEH integrated point of load converter; Intersil ISL70003SEH integrated point; single event effects testing; total dose testing; Capacitors; Gold; Ions; Regulators; Testing; Transient analysis; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937392
  • Filename
    6937392
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992379