• DocumentCode
    1992410
  • Title

    SEE test results of the LVDS Driver and Receiver

  • Author

    Wang, Pierre-Xiao ; Gil, Maria ; Widmer, Fabien ; Garcia, Paulo

  • Author_Institution
    3D Plus SAS, Buc, France
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report on results of SEE (SEL, SET) tests of LVDS Quad Drivers and Receivers from different manufactures. In particular, this report provides a good way to characterize SET from user point of view, calculated the error rate as SEU, and analyzes the SET result and determines if data are lost during an SET event.
  • Keywords
    driver circuits; integrated circuit testing; low-power electronics; radiation hardening (electronics); LVDS quad drivers; LVDS receiver; SEE test results; SEL tests; SET tests; low-voltage differential signaling; single event effect; single event latch-up; single event transient; Error analysis; Oscilloscopes; Power supplies; Radiation detectors; Receivers; Sensitivity; Wires; Cross Section; Error Rate; Lost Frame; Low-Voltage Differential Signaling (LVDS); Single Event Effect (SEE); Single Event Latch-up(SEL); Single Event Transient (SET); Single Event Upset(SEU);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937394
  • Filename
    6937394
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1992410