Title :
SEE test results of the LVDS Driver and Receiver
Author :
Wang, Pierre-Xiao ; Gil, Maria ; Widmer, Fabien ; Garcia, Paulo
Author_Institution :
3D Plus SAS, Buc, France
Abstract :
We report on results of SEE (SEL, SET) tests of LVDS Quad Drivers and Receivers from different manufactures. In particular, this report provides a good way to characterize SET from user point of view, calculated the error rate as SEU, and analyzes the SET result and determines if data are lost during an SET event.
Keywords :
driver circuits; integrated circuit testing; low-power electronics; radiation hardening (electronics); LVDS quad drivers; LVDS receiver; SEE test results; SEL tests; SET tests; low-voltage differential signaling; single event effect; single event latch-up; single event transient; Error analysis; Oscilloscopes; Power supplies; Radiation detectors; Receivers; Sensitivity; Wires; Cross Section; Error Rate; Lost Frame; Low-Voltage Differential Signaling (LVDS); Single Event Effect (SEE); Single Event Latch-up(SEL); Single Event Transient (SET); Single Event Upset(SEU);
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937394
