Recent proton and Co60 radiation test data from a newly developed European optocoupler source for space application

Author

Bregoli, M. ; Hernandez, S. ; Ress, C. ; Collini, A. ; Ficorella, F. ; How, L.S. ; Costantino, Alessandra ; Ferlet-Cavrois, Veronique ; Zahir, M.

Author_Institution

Optoelettronica Italia Srl, Gardolo, Italy

fYear

2013

fDate

23-27 Sept. 2013

Firstpage

1

Lastpage

5

Abstract

The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi´s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.

Keywords

cobalt; integrated circuit packaging; proton effects; space vehicle electronics; ⁶⁰Co; European optocoupler source; OIER10 code; leadless chip carrier packages; proton fluences; proton test data; radiation test data; space application; total ionizing dose; Degradation; Europe; Light emitting diodes; Phototransistors; Protons; Radiation effects; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on

Conference_Location

Oxford

Type

conf

DOI

10.1109/RADECS.2013.6937401

Filename

6937401