Title :
Proceedings of the 45th design automation conference
Abstract :
The following topics are dealt with: design; EDA concurrency; CAD for FPGA; analog performance modelling; manycore processors; formal verification; modern chip layout; application mapping; power efficiency; variation-aware design; multi-core simulation; mixed-signal power optimisation; nanodevices; dynamic verification; emerging biotechnologies; cache optimisation; embedded system modelling; ESL Hand-Off; analytical modelling; complex processing systems, debug and diagnosis; on-chip communication; advanced wireless design; packaging; die stacking; ESL methodologies; leakage analysis; statistical timing analysis; multi-core systems.
Keywords :
CMOS integrated circuits; electronic design automation; embedded systems; field programmable analogue arrays; formal verification; logic design; nanotechnology; packaging; program debugging; testing; wireless sensor networks; CAD; EDA concurrency; ESL Hand-Off; ESL methodologies; FPGA; advanced wireless design; analog performance modelling; analytical modelling; application mapping; automation; cache optimisation; complex processing systems; debug; diagnosis; die stacking; dynamic verification; embedded system modelling; emerging biotechnologies; formal verification; leakage analysis; manycore processors; mixed-signal power optimisation; modern chip layout; multi-core simulation; multi-core systems; nanodevices; on-chip communication; packaging; power efficiency; statistical timing analysis; variation-aware design;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6
