A Coaxial Test Fixture for Microwave Transistor Characterisation

A new microwave transistor test fixture is described incorporating a unique transistor insert design. The fixture is a modification of a commercial design, which allows a reduction of the manufacturing cost. The novel insert expands the capability of the test fixture to measure both packaged and unpackaged microwave transistors. Results of performance tests on a fixture prototype are briefly summarized and some experimental data on packaged and unpackaged transistor S-parameters are included.