• DocumentCode
    1993046
  • Title

    Wide bandwidth Bragg mirrors for multi-band filter chips

  • Author

    Olivares, J. ; Wegmann, E. ; Clement, M. ; Capilla, J. ; Iborra, E. ; Sangrador, J.

  • Author_Institution
    Grupo de Microsistemas y Mater. Electronicos, Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    2119
  • Lastpage
    2122
  • Abstract
    We investigate the performance of Bragg mirrors containing iridium and porous silicon dioxide layers as acoustic reflectors for aluminum nitride solidly mounted resonators. The very large mismatch between the acoustic impedances of these materials allow to broaden the bandwidth of the mirrors to values larger than 2 GHz. Bragg mirrors consisting of five alternating layer of Ir and porous SiO2 are designed and fabricated. Resonators of AlN with Ir electrodes with resonant frequencies ranging between 1.6 GHz and 2.7 GHz are built on top of the same Bragg mirror. Their coupling coefficients around 6% are roughly independent of the resonant frequency, whereas their quality factors vary from 1200 to 300 as the resonant frequency increases.
  • Keywords
    acoustic impedance; acoustic resonator filters; bulk acoustic wave devices; distributed Bragg reflectors; iridium; silicon compounds; Bragg mirror; Ir; SiO2; acoustic impedance; acoustic reflector; coupling coefficient; multiband filter chip; porous silicon dioxide layer; resonant frequency; solidly mounted resonator; Acoustic materials; Acoustic reflection; Aluminum nitride; Bandwidth; Electrodes; Impedance; Mirrors; Resonant frequency; Resonator filters; Silicon compounds; Acoustic reflector; BAW filters; Bragg mirrors; Iridium; Porous silicon oxide; component;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441498
  • Filename
    5441498