DocumentCode
1993229
Title
NAND flash memory in-flight data from PROBA-II spacecraft
Author
D´Alessio, M. ; Poivey, C. ; Walter, Dennis ; Gruermann, K. ; Gliem, F. ; Schmidt, Heidemarie ; Sorensen, R. Harboe ; Keating, Ana ; Fleurinck, N. ; Puimege, K. ; Gerrits, D. ; Mathijs, P.
Author_Institution
Eur. Space Agency, ESTEC, Noordwijk, Netherlands
fYear
2013
fDate
23-27 Sept. 2013
Firstpage
1
Lastpage
6
Abstract
This paper presents an analysis of SEE in-flight data on NAND flash memories on-board Technology Demonstration Module (TDM) flying on PROBA-II spacecraft. Proba-II spacecraft has been flying for more than 3 years on a LEO orbit. Observed in-flight error rates are compared with predictions based on ground test data.
Keywords
NAND circuits; flash memories; radiation hardening (electronics); space vehicle electronics; LEO orbit; NAND flash memory; PROBA-II spacecraft; SEI; SEU; single event effects; technology demonstration module; Flash memories; Monitoring; Protons; Reed-Solomon codes; Space vehicles; Temperature sensors; Time division multiplexing; Flash memory; SEU/SEL; Single Event Effects; hardness assurance; radiation experiment; radiation monitor; technology demonstration;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location
Oxford
Type
conf
DOI
10.1109/RADECS.2013.6937432
Filename
6937432
Link To Document