• DocumentCode
    1993229
  • Title

    NAND flash memory in-flight data from PROBA-II spacecraft

  • Author

    D´Alessio, M. ; Poivey, C. ; Walter, Dennis ; Gruermann, K. ; Gliem, F. ; Schmidt, Heidemarie ; Sorensen, R. Harboe ; Keating, Ana ; Fleurinck, N. ; Puimege, K. ; Gerrits, D. ; Mathijs, P.

  • Author_Institution
    Eur. Space Agency, ESTEC, Noordwijk, Netherlands
  • fYear
    2013
  • fDate
    23-27 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents an analysis of SEE in-flight data on NAND flash memories on-board Technology Demonstration Module (TDM) flying on PROBA-II spacecraft. Proba-II spacecraft has been flying for more than 3 years on a LEO orbit. Observed in-flight error rates are compared with predictions based on ground test data.
  • Keywords
    NAND circuits; flash memories; radiation hardening (electronics); space vehicle electronics; LEO orbit; NAND flash memory; PROBA-II spacecraft; SEI; SEU; single event effects; technology demonstration module; Flash memories; Monitoring; Protons; Reed-Solomon codes; Space vehicles; Temperature sensors; Time division multiplexing; Flash memory; SEU/SEL; Single Event Effects; hardness assurance; radiation experiment; radiation monitor; technology demonstration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
  • Conference_Location
    Oxford
  • Type

    conf

  • DOI
    10.1109/RADECS.2013.6937432
  • Filename
    6937432