DocumentCode
1993693
Title
Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization
Author
Wang, Xinming ; Cheung, S.C. ; Chan, W.K. ; Zhang, Zhenyu
Author_Institution
Dept. of Comp. Sci. & Eng., HKUST, Hong Kong
fYear
2009
fDate
16-24 May 2009
Firstpage
45
Lastpage
55
Abstract
Recent techniques for fault localization leverage code coverage to address the high cost problem of debugging. These techniques exploit the correlations between program failures and the coverage of program entities as the clue in locating faults. Experimental evidence shows that the effectiveness of these techniques can be affected adversely by coincidental correctness, which occurs when a fault is executed but no failure is detected. In this paper, we propose an approach to address this problem. We refine code coverage of test runs using control- and data-flow patterns prescribed by different fault types. We conjecture that this extra information, which we call context patterns, can strengthen the correlations between program failures and the coverage of faulty program entities, making it easier for fault localization techniques to locate the faults. To evaluate the proposed approach, we have conducted a mutation analysis on three real world programs and cross-validated the results with real faults. The experimental results consistently show that coverage refinement is effective in easing the coincidental correctness problem in fault localization techniques.
Keywords
data flow analysis; program debugging; program testing; software fault tolerance; system recovery; coincidental correctness taming; context pattern; control-flow pattern; coverage refinement; data-flow pattern; fault localization; mutation analysis; program debugging; program entity; program failure; program test; Cities and towns; Costs; Councils; Debugging; Fault detection; Fault diagnosis; Genetic mutations; Software maintenance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, 2009. ICSE 2009. IEEE 31st International Conference on
Conference_Location
Vancouver, BC
ISSN
0270-5257
Print_ISBN
978-1-4244-3453-4
Type
conf
DOI
10.1109/ICSE.2009.5070507
Filename
5070507
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