Title :
The estimation of long time operation bipolar devices in space environment using conversion model of ELDRS
Author :
Pershenkov, V.S. ; Bakerenkov, A.S. ; Solomatin, A.V. ; Belyakov, V.V.
Author_Institution :
Moscow Eng. Phys. Inst., Moscow, Russia
Abstract :
On base of the proposed conversion model, the radiation degradation of LM111 comparator input current is considered during dose rate variation corresponding 12 hour orbit, cyclic device temperature variation and impact of solar flare during space mission.
Keywords :
bipolar transistors; comparators (circuits); radiation hardening (electronics); solar flares; ELDRS; LM111 comparator input current; conversion model; long time operation bipolar devices; radiation degradation; solar flare; space environment; space mission; Annealing; Degradation; Electron traps; Estimation; Radiation effects; Space vehicles; Temperature; ELDRS; comparator; conversion model; interface trap;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on
Conference_Location :
Oxford
DOI :
10.1109/RADECS.2013.6937456
