Title :
ESD issues in compound semiconductor high frequency devices and circuits
Author_Institution :
IMEC, Kapeldreef 75, B-3001 Leuven ,Belgium
Abstract :
The need of (electrostatic discharge) ESD protection for high frequency devices and circuits is underlined by reviewing the compound semiconductor material properties with emphasis to ESD stress and by collecting their ESD failure thresholds. Basic requirements for possible ESD protection structures in the microwave frequency regime are discussed and possible ESD protection devices and circuit concepts are proposed.
Keywords :
Circuits; Electrostatic discharge; Frequency; MMICs; Material properties; Protection; Semiconductor materials; Silicon; Thermal conductivity;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1997.634220