• DocumentCode
    1993903
  • Title

    ESD issues in compound semiconductor high frequency devices and circuits

  • Author

    Bock, K.

  • Author_Institution
    IMEC, Kapeldreef 75, B-3001 Leuven ,Belgium
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    The need of (electrostatic discharge) ESD protection for high frequency devices and circuits is underlined by reviewing the compound semiconductor material properties with emphasis to ESD stress and by collecting their ESD failure thresholds. Basic requirements for possible ESD protection structures in the microwave frequency regime are discussed and possible ESD protection devices and circuit concepts are proposed.
  • Keywords
    Circuits; Electrostatic discharge; Frequency; MMICs; Material properties; Protection; Semiconductor materials; Silicon; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634220
  • Filename
    634220