Standardization of profilometry measurements in dental implants

Author

Clark, Melissa B. ; Kohles, Sean S. ; Brown, Hristopher A. ; Kenealy, James N.

Author_Institution

Dept. of Mech. Eng., Worcester Polytech. Inst., MA, USA

fYear

2000

fDate

2000

Firstpage

5

Lastpage

6

Abstract

Surface quality is one characteristic of dental implants known to control long-term stability after in vivo implantation. Various surface preparation techniques exist to control surface roughness. Specific protocols for quantifying the resulting roughness are varied and dependent upon the specific parameter produced by the particular measurement device. In this study, measures of accuracy and precision associated with dental implant profilometry techniques are determined

Keywords

atomic force microscopy; biomedical materials; biomedical measurement; dentistry; light interferometry; optical microscopy; prosthetics; scanning electron microscopy; standardisation; surface topography measurement; AFM; SEM; bone-implant contact; dental implants; in vivo implantation; interferometry; laser scanning confocal microscope; long-term stability; profilometry measurements; standardization; stylus profilometer; surface quality; surface roughness; Atomic force microscopy; Biomedical measurements; Dentistry; Implants; Rough surfaces; Scanning electron microscopy; Standardization; Surface morphology; Surface roughness; Surface topography;

fLanguage

English

Publisher

ieee

Conference_Titel

Bioengineering Conference, 2000. Proceedings of the IEEE 26th Annual Northeast

Conference_Location

Storrs, CT

Print_ISBN

0-7803-6341-8

Type

conf

DOI

10.1109/NEBC.2000.842351

Filename

842351