Title :
Standardization of profilometry measurements in dental implants
Author :
Clark, Melissa B. ; Kohles, Sean S. ; Brown, Hristopher A. ; Kenealy, James N.
Author_Institution :
Dept. of Mech. Eng., Worcester Polytech. Inst., MA, USA
Abstract :
Surface quality is one characteristic of dental implants known to control long-term stability after in vivo implantation. Various surface preparation techniques exist to control surface roughness. Specific protocols for quantifying the resulting roughness are varied and dependent upon the specific parameter produced by the particular measurement device. In this study, measures of accuracy and precision associated with dental implant profilometry techniques are determined
Keywords :
atomic force microscopy; biomedical materials; biomedical measurement; dentistry; light interferometry; optical microscopy; prosthetics; scanning electron microscopy; standardisation; surface topography measurement; AFM; SEM; bone-implant contact; dental implants; in vivo implantation; interferometry; laser scanning confocal microscope; long-term stability; profilometry measurements; standardization; stylus profilometer; surface quality; surface roughness; Atomic force microscopy; Biomedical measurements; Dentistry; Implants; Rough surfaces; Scanning electron microscopy; Standardization; Surface morphology; Surface roughness; Surface topography;
Conference_Titel :
Bioengineering Conference, 2000. Proceedings of the IEEE 26th Annual Northeast
Conference_Location :
Storrs, CT
Print_ISBN :
0-7803-6341-8
DOI :
10.1109/NEBC.2000.842351
