Title :
A New Biasing Circuit for High Integration Density GaAs MMIC´S
Author :
Rumelhard, C. ; Carnez, B.
Keywords :
Circuit testing; Gallium arsenide; Logic circuits; MESFETs; Microwave FETs; Microwave circuits; Microwave frequencies; Microwave measurements; Microwave transistors; Voltage;
Conference_Titel :
Microwave Conference, 1985. 15th European
Conference_Location :
Paris, France
DOI :
10.1109/EUMA.1985.333597
