• DocumentCode
    1994555
  • Title

    A Novel FPGA-based Evolvable Hardware System Based on Multiple Processing Arrays

  • Author

    Gallego, Angel ; Mora, Javier ; Otero, Andres ; Salvador, Ricardo ; de la Torre, E. ; Riesgo, T.

  • Author_Institution
    Centre of Ind. Electron.-CEI, Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    182
  • Lastpage
    191
  • Abstract
    In this paper, an architecture based on a scalable and flexible set of Evolvable Processing arrays is presented. FPGA-native Dynamic Partial Reconfiguration (DPR) is used for evolution, which is done intrinsically, letting the system to adapt autonomously to variable run-time conditions, including the presence of transient and permanent faults. The architecture supports different modes of operation, namely: independent, parallel, cascaded or bypass mode. These modes of operation can be used during evolution time or during normal operation. The evolvability of the architecture is combined with fault-tolerance techniques, to enhance the platform with self-healing features, making it suitable for applications which require both high adaptability and reliability. Experimental results show that such a system may benefit from accelerated evolution times, increased performance and improved dependability, mainly by increasing fault tolerance for transient and permanent faults, as well as providing some fault identification possibilities. The evolvable HW array shown is tailored for window-based image processing applications.
  • Keywords
    fault tolerant computing; field programmable gate arrays; multiprocessing systems; reconfigurable architectures; DPR; FPGA-based evolvable hardware system; FPGA-native dynamic partial reconfiguration; accelerated evolution times; architecture evolvability; bypass mode; cascaded mode; evolvable HW array; evolvable processing arrays; fault identification; fault-tolerance techniques; independent mode; multiple processing arrays; parallel mode; permanent faults; self-healing features; transient faults; variable run-time conditions; window-based image processing; Adaptive arrays; Arrays; Circuit faults; Fault tolerance; Parallel processing; Tunneling magnetoresistance; Reconfigurability; adaptability; evolvable hardware; evolvable systems; fault tolerance; scalability; selfhealing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2013 IEEE 27th International
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-0-7695-4979-8
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2013.56
  • Filename
    6650885