Title :
Design methodology of multistage time-domain logic speculation circuits
Author :
Sun, Yinan ; Liu, Yongpan ; Wang, Xiaohan ; Xu, Hongliang ; Yang, Huazhong
Author_Institution :
EE Dept., Tsinghua Univ., Beijing, China
Abstract :
As variable delays are observed in the integrated circuits under different data inputs, it is expected to enhance the performance of the circuit using the average-case design methodology. This paper presents a novel approach using the time-domain multistage speculation to realize a variable-latency circuit, in which speculation points with double-sampling and check-recovery units are inserted into the critical path to enhance the performance. Furthermore, a design framework is implemented to convert a original circuit into the new one automatically. Experimental results showed that a 1.79 - 4.42 speedup in a 64-bit ripple carry adder and up to 30.5% throughput enhancements in several ISCAS and MCNC benchmarks with reasonable area overheads.
Keywords :
benchmark testing; integrated circuit design; integrated circuit testing; integrated logic circuits; time-domain synthesis; 64-bit ripple carry adder; ISCAS benchmark; MCNC benchmark; average-case design methodology; check-recovery unit; data input; integrated circuit delay; multistage time-domain logic speculation circuit; throughput enhancement; variable-latency circuit; Adders; Benchmark testing; Clocks; Delay; Logic gates; Throughput; Time domain analysis;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5937970