DocumentCode :
1994944
Title :
Eigenfrequency of cavity resonators at different reflection conditions
Author :
Peter, Andreas ; Vassileva, Svetla
Author_Institution :
Fak. Elektrotechnik, Hochschule fur Tech. und Wirtschaft Dresden, Dresden, Germany
fYear :
2009
fDate :
20-23 Sept. 2009
Firstpage :
1606
Lastpage :
1609
Abstract :
The paper describes the results of complex wall impedance measurements and the influence to the eigenfrequencies and Q-factors of cavity resonators. The prediction of the eigenfrequency of cavity resonators under non-ideal reflection conditions is technical relevant to develop acoustic gas sensors for industrial use.
Keywords :
acoustic impedance; acoustic resonators; acoustic wave reflection; chemical variables measurement; eigenvalues and eigenfunctions; gas sensors; nonlinear acoustics; Q-factor; acoustic gas sensor; cavity resonators; complex wall impedance measurement; eigenfrequency; non-ideal reflection condition; Acoustic measurements; Acoustic reflection; Boundary conditions; Cavity resonators; Control systems; Gas detectors; Gas industry; Impedance measurement; Q factor; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
ISSN :
1948-5719
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
Type :
conf
DOI :
10.1109/ULTSYM.2009.5441577
Filename :
5441577
Link To Document :
بازگشت