DocumentCode :
1995027
Title :
Effects of SINR estimation errors on the DL cell throughput of an LTE system in different environments
Author :
Ostermayer, Gerald ; Neumeier, Roland ; Eder, Sebastian
Author_Institution :
Dept. Mobile Comput., UAS Upper Austria, Hagenberg, Austria
fYear :
2013
fDate :
26-28 Nov. 2013
Firstpage :
196
Lastpage :
201
Abstract :
In this paper we analyze the influence of errors in SINR estimation on the system level performance of an LTE system. Additionally we investigate the effect of the selection of the SINR/CQI mapping curve on the cell throughput and error resistance. We focus on downlink scenarios in a macro-cell (57 cells deployed in a hexagonal grid) and a micro-cell environment (Manhattan grid deployment with 72 cells). Up to 20 users are simultaneously active in the observed cell. For that we use a Best CQI scheduling algorithm. Our investigations are done using a simulation environment based on two tools with different modeling accuracy. With that approach the simulation runtime can be kept short enough in order to produce results efficiently. Simulations have shown that the LTE system is very resistant to SINR estimation errors, but it does not always achieve the best cell throughput performance when operating with the parameters for the SINR-to-modulation-and-coding curves recommended in the LTE-standard documents [1]. However, by increasing cell throughput performance, the resistance to SINR estimation errors decreases.
Keywords :
Long Term Evolution; channel estimation; error statistics; DL cell throughput; LTE system; SINR estimation errors; SINR/CQI mapping curve; error resistance; Channel estimation; Estimation error; Interference; Mobile communication; Receivers; Signal to noise ratio; Throughput; CQI; LTE; SINR estimation error; cell throughput; performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (MICC), 2013 IEEE Malaysia International Conference on
Conference_Location :
Kuala Lumpur
Type :
conf
DOI :
10.1109/MICC.2013.6805824
Filename :
6805824
Link To Document :
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