DocumentCode :
1995435
Title :
Falling Through the Cracks? Public Perception, Risk, and the Oversight of Emerging Nanotechnologies
Author :
Michelson, Evan S. ; Rejeski, David
Author_Institution :
Woodrow Wilson Int. Center for Scholars, Washington
fYear :
2006
fDate :
8-10 June 2006
Firstpage :
1
Lastpage :
17
Abstract :
Nanotechnology is expected to be the key technology of the 21st century. Researchers are exploring ways to see and build at this scale, reengineering familiar substances like carbon and silver to create new materials with novel properties and functions. However, the emergence of nanotechnology also provides us with an opportunity to reshape how the public perceives the government´s ability to manage risks posed by new technologies. As the first wave of nano-based products-including cosmetics, dietary supplements, food additives, and consumer products-enters the market, society will begin to ask questions about the health, environmental, and safety implications of these materials. The purpose of this paper is to connect the current state of such public perceptions-both with respect to nanotechnology, in particular, and to emerging technologies, in general-with the current state of nanotechnology product development and to analyze how well situated the public sector is to deal with these challenges.
Keywords :
nanotechnology; product development; risk management; safety; consumer products; cosmetics; dietary supplements; food additives; nanobased products; nanotechnologies; product development; public perception; risk; safety implications; Additives; Disaster management; Food technology; Health and safety; Organic materials; Product safety; Risk management; Silver; Technology management; US Government;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technology and Society, 2006. ISTAS 2006. IEEE International Symposium on
Conference_Location :
Queens, NY
Print_ISBN :
978-1-4244-0479-7
Electronic_ISBN :
978-1-4244-0479-7
Type :
conf
DOI :
10.1109/ISTAS.2006.4375890
Filename :
4375890
Link To Document :
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