Title :
The ultrasound brain helmet for 3D transcranial Doppler imaging
Author :
Lindsey, Brooks D. ; Ivancevich, Nikolas M. ; Light, Edward D. ; Smith, Stephen W. ; Nicoletto, Heather A. ; Bennett, Ellen ; Laskowitz, Daniel T.
Author_Institution :
Dept. of Biomed. Eng., Duke Univ., Durham, NC, USA
Abstract :
Transcranial Doppler imaging with contrast enhancement is a promising approach for visualizing a variety of cerebrovascular diseases requiring rapid treatment to minimize long-term effects. To address the time-sensitive nature of these diseases, we present a real-time 3D ultrasound scanner capable of simultaneously acquiring two trans-temporal volumes with color and spectral Doppler capabilities. To improve the clinical value of these scans, we also present fused, rendered 3D volumes and a rapid technique for registering these volumes. In an in vivo study, we were able to visualize blood flow in the internal carotid arteries, encouraging further development of this system. When combined with presented techniques for phase correction and instrumentation improvements, we envision these visualization techniques may potentially provide clinicians with a rapid, definitive tool to aid in diagnosis.
Keywords :
Doppler measurement; biomedical transducers; biomedical ultrasonics; blood flow measurement; brain; diseases; image registration; medical image processing; neurophysiology; ultrasonic transducers; 3D transcranial Doppler imaging; blood flow visualization; cerebrovascular diseases; contrast enhancement; instrumentation improvements; internal carotid arteries; phase correction; real-time 3D ultrasound scanner; time-sensitive nature; trans-temporal volumes; ultrasound brain helmet; Acoustic transducers; Biomedical imaging; Biomedical transducers; Blood flow; Diseases; Medical diagnostic imaging; Skull; Ultrasonic imaging; Ultrasonic transducers; Visualization; 3D ultrasound; Contrast-enhanced ultrasound; Transcranial; phase aberration; ultrasound volume registration;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441617