Title :
ESD sources pinpointed by analysis of radio wave emissions
Author :
Bernier, Joe ; Croft, Gregg ; Lowther, Rex
Author_Institution :
Harris Semiconductor
Abstract :
ESD events are a source of radio waves. Time delay information from a system of antennas detecting those radio waves can be used, much like a GPS system, to pinpoint the location of the discharge. Such a system is described and experimental results presented.
Keywords :
Delay effects; Electronics industry; Electrostatic discharge; Event detection; Fault location; Global Positioning System; Manufacturing industries; Testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1997.634229
