• DocumentCode
    1996324
  • Title

    Self-quenching, Forward-bias-reset for Single Photon Avalanche Detectors in 1.8V, 0.18µm process

  • Author

    Lee, Changhyuk ; Molnar, Alyosha

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    2217
  • Lastpage
    2220
  • Abstract
    We present a fully integrated, Single Photon Avalanche Detector (SPAD) using only standard low-voltage (1.8V) CMOS devices in a 0.18 μm process. The system requires one high-voltage AC signal which alternately reverse biases the SPADs into avalanche breakdown and then resets with a forward bias. The proposed self-quenching circuit intrinsically suppresses after-pulse effects, improving signal to noise ratio while still permitting fine time resolution. The required high- voltage AC signal can be generated by resonant structures and can be shared across arrays of SPADs.
  • Keywords
    CMOS image sensors; avalanche breakdown; avalanche diodes; SPAD; after-pulse effect suppression; fine time resolution; high-voltage AC signal; self-quenching forward-bias-reset circuit; signal to noise ratio; single photon avalanche detector; size 0.18 mum; standard low-voltage CMOS device; voltage 1.8 V; Anodes; CMOS integrated circuits; Capacitors; Detectors; Junctions; Photonics; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5938041
  • Filename
    5938041