DocumentCode :
1996324
Title :
Self-quenching, Forward-bias-reset for Single Photon Avalanche Detectors in 1.8V, 0.18µm process
Author :
Lee, Changhyuk ; Molnar, Alyosha
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
2217
Lastpage :
2220
Abstract :
We present a fully integrated, Single Photon Avalanche Detector (SPAD) using only standard low-voltage (1.8V) CMOS devices in a 0.18 μm process. The system requires one high-voltage AC signal which alternately reverse biases the SPADs into avalanche breakdown and then resets with a forward bias. The proposed self-quenching circuit intrinsically suppresses after-pulse effects, improving signal to noise ratio while still permitting fine time resolution. The required high- voltage AC signal can be generated by resonant structures and can be shared across arrays of SPADs.
Keywords :
CMOS image sensors; avalanche breakdown; avalanche diodes; SPAD; after-pulse effect suppression; fine time resolution; high-voltage AC signal; self-quenching forward-bias-reset circuit; signal to noise ratio; single photon avalanche detector; size 0.18 mum; standard low-voltage CMOS device; voltage 1.8 V; Anodes; CMOS integrated circuits; Capacitors; Detectors; Junctions; Photonics; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
ISSN :
0271-4302
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
Type :
conf
DOI :
10.1109/ISCAS.2011.5938041
Filename :
5938041
Link To Document :
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