• DocumentCode
    1996426
  • Title

    3D monolithic integration

  • Author

    Batude, P. ; Vinet, M. ; Pouydebasque, A. ; Royer, C. Le ; Previtali, B. ; Tabone, C. ; Hartmann, J. -M ; Sanchez, L. ; Baud, L. ; Carron, V. ; Toffoli, A. ; Allain, F. ; Mazzocchi, V. ; Lafond, D. ; Deleonibus, S. ; Faynot, O.

  • Author_Institution
    Leti, CEA, Grenoble, France
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    2233
  • Lastpage
    2236
  • Abstract
    3D monolithic integration, thanks to its high vertical density of interconnections, is the only available option for applications requiring connections at the transistor scale. However to achieve 3D monolithic integration, some issues such as realization of high quality top film, high stability bottom FET, low thermal budget top FET still have to be solved. In this work, a 3D monolithic process flow relying on molecular wafer bonding is proposed and results in all critical steps are given. Significant breakthroughs have been obtained using a full wafer molecular bonding with thin interlayer dielectric and an original salicidation process stabilized up to 650°C enabling to reach high performance for the top and bottom transistor. With such technology, we demonstrate functional top and bottom transistors as well as 3D structures such as invertors and SRAMs.
  • Keywords
    SRAM chips; integrated circuit bonding; invertors; three-dimensional integrated circuits; transistors; 3D monolithic integration; 3D monolithic process flow; 3D structures; SRAM; bottom transistor; full wafer molecular bonding; invertors; molecular wafer bonding; salicidation process; thin interlayer dielectric; top transistor; Bonding; FETs; Logic gates; Monolithic integrated circuits; Silicon; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5938045
  • Filename
    5938045