Title :
A line drawings degradation model for performance characterization
Author :
Zhai, Jian ; Wenyin, Liu ; Dori, Dov ; Li, Qing
Author_Institution :
City University of Hong Kong
Keywords :
Algorithm design and analysis; Degradation; Detection algorithms; Engineering drawings; Gaussian noise; Information technology; Noise level; Noise robustness; Testing; Text analysis;
Conference_Titel :
Document Analysis and Recognition, 2003. Proceedings. Seventh International Conference on
Print_ISBN :
0-7695-1960-1
DOI :
10.1109/ICDAR.2003.1227813
