• DocumentCode
    1996765
  • Title

    Sub-pixel accuracy edge fitting by means of B-spline

  • Author

    Breder, R. ; Estrela, Vania Vieira ; De Assis, Joaquim Teixeira

  • Author_Institution
    Polytech. Inst. of Rio de Janeiro (IPRJ), State Univ. of Rio de Janeiro (UERJ), Nova Friburgo, Brazil
  • fYear
    2009
  • fDate
    5-7 Oct. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Local perturbations around contours strongly disturb the final result of computer vision tasks. It is common to introduce a priori information in the estimation process. Improvement can be achieved via a deformable model such as the snake model. In recent works, the deformable contour is modeled by means of B-spline snakes which allows local control, concise representation, and the use of fewer parameters. The estimation of the sub-pixel edges using a global B-spline model relies on the contour global determination according to a maximum likelihood framework and using the observed data likelihood. This procedure guarantees that the noisiest data will be filtered out. The data likelihood is computed as a consequence of the observation model which includes both orientation and position information. Comparative experiments of this algorithm and the classical spline interpolation have shown that the proposed algorithm outperforms the classical approach for Gaussian and Salt & Pepper noise.
  • Keywords
    computer vision; edge detection; maximum likelihood estimation; splines (mathematics); B-spline model; Gaussian and Salt & Pepper noise; computer vision tasks; contour global determination; estimation process; local perturbations; maximum likelihood framework; observed data likelihood; spline interpolation; sub-pixel accuracy edge fitting; Computer vision; Deformable models; Filtering; Image edge detection; Interpolation; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Polynomials; Spline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia Signal Processing, 2009. MMSP '09. IEEE International Workshop on
  • Conference_Location
    Rio De Janeiro
  • Print_ISBN
    978-1-4244-4463-2
  • Electronic_ISBN
    978-1-4244-4464-9
  • Type

    conf

  • DOI
    10.1109/MMSP.2009.5293265
  • Filename
    5293265