Title :
Measurements of acoustic properties of ZnO single crystals by the LFB/PW ultrasonic material characterization system
Author :
Kourai, Y. ; Yoshida, Sigeru ; Ohashi, Yoshimasa ; Arakawa, Mototaka ; Kushibiki, Jun-ichi ; Sakagami, Norimitsu
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
Abstract :
We evaluated the resistivities of a Z-cut ZnO single crystal plate specimen by measuring longitudinal-wave propagation characteristics (velocity and attenuation) in frequencies from 50 MHz to 1.5 GHz and also leaky surface acoustic wave (LSAW) velocities (VLSAW) on the specimen surfaces at 225 MHz using a line-focus-beam/plane-wave (LFB/PW) ultrasonic material characterization (UMC) system. A slight decrease of VLSAW was observed on -Z-plane of the specimen initially prepared in comparison with VLSAW on the +Z surface. The corresponding Z-axis longitudinal-wave propagation characteristics exhibited significant velocity dispersion and frequency dependence of attenuation associated with relatively low resistivity. For the specimen by removing the -Z side surface by about 0.5-mm thickness, we observed the same high VLSAW on both the ±Z surfaces. We could estimate the resistivities of 1·104 ¿m for the specimen after removal of the 0.5-mm thick layer and 30 ¿m to 1·104 ¿m distributed for the removed layer. This approach will contribute to establish our resistivity evaluation method using the LSAW propagation characteristics.
Keywords :
II-VI semiconductors; electrical resistivity; surface acoustic waves; ultrasonic dispersion; ultrasonic materials testing; ultrasonic velocity; wide band gap semiconductors; zinc compounds; ZnO; acoustic properties; acoustic wave dispersion; frequency 50 MHz to 1.5 GHz; leaky surface acoustic wave velocity; line-focus-beam characterization; longitudinal-wave propagation; plane-wave characterization; resistivity; ultrasonic material characterization; Acoustic materials; Acoustic measurements; Attenuation measurement; Conductivity; Crystalline materials; Crystals; Frequency measurement; Surface acoustic waves; Ultrasonic variables measurement; Zinc oxide; ZnO single crystal; attenuation coefficient; dielectric relaxation; leaky surface acoustic wave velocity; line-focus-beam / plane-wave ultrasonic material characterization system; longitudinal wave velocity; resistivity;
Conference_Titel :
Ultrasonics Symposium (IUS), 2009 IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4389-5
Electronic_ISBN :
1948-5719
DOI :
10.1109/ULTSYM.2009.5441664