DocumentCode :
1997209
Title :
Wavelet based features of circular scan lines for mammographic mass classification
Author :
Dash, Jatindra Kumar ; Sahoo, Laxmikant
Author_Institution :
Dept. of E&ECE, Indian Inst. of Technol., Kharagpur, India
fYear :
2012
fDate :
15-17 March 2012
Firstpage :
58
Lastpage :
61
Abstract :
Breast cancer is reported as the second most deadly cancer in the world on which public awareness has been increasing during the last few decades. Early detection can play an effective role in prevention and the most reliable detection technology is mammography. At the early stages of breast cancer, the clinical signs are very mild and vary in appearance, making diagnosis difficult even for specialists. Therefore, automatic reading of medical images becomes highly desirable. This paper aims to develop an automated system for mass classification in digital mammograms. Mini - MIAS database is used to obtain mammogram images. A novel approach for feature extraction is proposed which exploits the wavelet features of radial and circular scan lines drawn over the region of interest (ROI). The discriminating ability of these features are evaluated using three classifiers such as Neural Network (Scaled conjugate back propagation), Bayesian and Support Vector Machine (SVM). The experimental results show that SVM outperforms with an accuracy of 85.96%.
Keywords :
backpropagation; belief networks; cancer; feature extraction; image classification; mammography; medical image processing; neural nets; support vector machines; visual databases; wavelet transforms; Bayesian network; Mini-MIAS database; breast cancer; circular scan line; detection technology; digital mammograms; feature extraction; mammographic mass classification; medical image reading; neural network; region of interest; scaled conjugate backpropagation; support vector machine; wavelet based feature; Accuracy; Cancer; Databases; Feature extraction; Support vector machines; Training; Wavelet transforms; Bayesian classifier; mammogram; mass classification; neural network; radial and circular features; support vector machine; wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Recent Advances in Information Technology (RAIT), 2012 1st International Conference on
Conference_Location :
Dhanbad
Print_ISBN :
978-1-4577-0694-3
Type :
conf
DOI :
10.1109/RAIT.2012.6194480
Filename :
6194480
Link To Document :
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