Title :
X-ray detection characteristics of thallium bromide nuclear radiation detectors
Author :
Hitomi, K. ; Muroi, O. ; Matsumoto, M. ; Hirabuki, R. ; Shoji, T. ; Hiratate, Y.
Author_Institution :
Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan
Abstract :
Semiconductor X-ray detectors have been fabricated from high purity TlBr crystals grown by the traveling molten zone method. X-ray detection characteristics of the TlBr detectors in the individual quantum pulse mode as well as in the current mode have been studied. An energy resolution of 2.5 keV FWHM has been recorded for 22 keV X-rays with a TlBr detector operated in the individual quantum pulse mode at room temperature. The TlBr detectors in the current mode have been tested as flux detectors for an X-ray CT scanner system of a first generation type. The performance of the system has been tested using a wooden phantom. The X-ray CT system has shown good imaging capabilities
Keywords :
X-ray detection; computerised tomography; diagnostic radiography; semiconductor counters; thallium compounds; 22 keV; TlBr; X-ray CT scanner system; X-ray detection characteristics; energy resolution; high purity TlBr crystals; individual quantum pulse mode; semiconductor X-ray detectors; thallium bromide nuclear radiation detectors; traveling molten zone method; wooden phantom; Computed tomography; Crystals; Energy resolution; Imaging phantoms; Optical imaging; System testing; Temperature; X-ray detection; X-ray detectors; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5696-9
DOI :
10.1109/NSSMIC.1999.842504
