مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1997485

Title :

Foreword

fYear :

2008

fDate :

25-29 May 2008

Abstract :

Presents the introductory welcome message from the conference proceedings.

Keywords :

Circuit testing; Circuits and systems; Design engineering; Electronic equipment testing; Europe; Power system reliability; Reliability engineering; Semiconductor device reliability; Semiconductor device testing; System testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Symposium, 2008 13th European

Conference_Location :

Verbania

Print_ISBN :

978-0-7695-3150-2

Type :

conf

DOI :

10.1109/ETS.2008.4

Filename :

4556013

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1997485