An oscillator-based true random number generator with process and temperature tolerance

Author

Amaki, Takehiko ; Hashimoto, Masanori ; Onoye, Takao

Author_Institution

Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan

fYear

2015

fDate

19-22 Jan. 2015

Firstpage

4

Lastpage

5

Abstract

This paper presents an oscillator-based true random number generator (TRNG) that automatically adjusts the duty cycle of a fast oscillator to 50 %, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. Measurement results with 65nm test chips show that the proposed TRNG adjusted the probability of `1´ to within 50 ± 0.07 % in five chips in the temperature range of 0 °C to 75 °C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm² area.

Keywords

electronic engineering computing; oscillators; random number generation; DIEHARD tests; NIST; TRNG; bit rate 7.5 Mbit/s; duty cycle; dynamic temperature fluctuation tolerance; fast oscillator-based true random number generator; process variation tolerance; size 65 nm; temperature 0 degC to 75 degC; test chips; unbiased random numbers; Entropy; Generators; Monitoring; NIST; Oscillators; Temperature measurement; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific

Conference_Location

Chiba

Print_ISBN

978-1-4799-7790-1

Type

conf

DOI

10.1109/ASPDAC.2015.7058918

Filename

7058918