Detection and correction of soft errors in memory system

Nowadays, The memory applications are more concerned with single event upsets. They invert the stored logic values in flip flop and memory cells. This issue is more serious when the affected memory cells are part of the configuration memory used for programming the circuit functionality. The occurrence of error can be corrected by reprogramming, which is caused due the alteration of circuit functionality. Here we have compared two decoders of error correction codes for issues in the programming circuits. A Hamming Decoder and a One-Step Majority Logic Decoder (OS-MLD) for the Difference-Set Cyclic Codes (DSCC) are analyzed yielding surprisingly unexpected results for their SEU susceptibility, which are interesting for application designers.