An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing

Author

Korhonen, E. ; Kostamovaara, J.

Author_Institution

Lab. of Electron., Oulu Univ., Oulu

fYear

2008

fDate

25-29 May 2008

Firstpage

149

Lastpage

154

Abstract

This paper presents an improved stimulus identification algorithm for histogram-based A/D converter testing. The mathematical theory behind the improvements is described and simulation results supporting this theory are presented. The stimulus identification method enables the linearity of ADCs to be tested without a highly linear or pure test stimulus. Simulations predict that the INL of 16-b ADCs can be measured with an accuracy of 0.5 LSB using only a 75 dBc pure sinusoidal test stimulus, whereas the standardized histogram test method requires a pure test stimulus of over 105 dBc.

Keywords

analogue-digital conversion; identification; integrated circuit testing; histogram test method; histogram-based A/D converter testing; mathematical theory; sinusoidal test stimulus; stimulus identification algorithm; stimulus identification method; Automatic testing; Built-in self-test; Cost function; Electronic equipment testing; Feedback; Histograms; Laboratories; Linearity; Test equipment; Voltage; A/D converter (ADC); built-in self-test (BIST); histogram test; integral non-linearity (INL); stimulus identification;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2008 13th European

Conference_Location

Verbania

Print_ISBN

978-0-7695-3150-2

Type

conf

DOI

10.1109/ETS.2008.17

Filename

4556041