DocumentCode :
1998072
Title :
Risks for Signal Integrity in System in Package and Possible Remedies
Author :
Rossi, D. ; Angelini, P. ; Metra, C. ; Campardo, G. ; Vanalli, G.P.
Author_Institution :
DEIS, Univ. of Bologna, Bologna
fYear :
2008
fDate :
25-29 May 2008
Firstpage :
165
Lastpage :
170
Abstract :
We analyze the electrical phenomena that can affect the integrity of the communication among different chips within a system in package (SiP). We address these issues for a real case, for which electrical parameters are extracted from layout and used to build a netlist employed for electrical characterization. We show that crosstalk, and in particular inductive crosstalk, is the electrical phenomenon mainly affecting signal transmission within the SiP. Then, we evaluate the kinds of errors that can be originated. We show that errors caused by inductive coupling among SiP interconnects can be unidirectional only, thus allowing designers to implement error control coding techniques based on all unidirectional error detecting codes. This allows significant cost reduction over the alternate use of non-unidirectional error detecting codes.
Keywords :
crosstalk; error correction codes; error detection codes; integrated circuit interconnections; integrated circuit layout; system-in-package; SiP interconnects; circuit layout; cost reduction; electrical characterization; error control coding techniques; inductive coupling; inductive crosstalk; signal integrity; signal transmission; system in package; unidirectional error detecting codes; Costs; Couplings; Crosstalk; Electronics packaging; Error correction codes; Intersymbol interference; Logic; Risk analysis; Signal analysis; System testing; Crosstalk; Error Detecting Codes; Signal Integrity; System in Package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2008 13th European
Conference_Location :
Verbania
Print_ISBN :
978-0-7695-3150-2
Type :
conf
DOI :
10.1109/ETS.2008.23
Filename :
4556043
Link To Document :
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