• DocumentCode
    1998072
  • Title

    Risks for Signal Integrity in System in Package and Possible Remedies

  • Author

    Rossi, D. ; Angelini, P. ; Metra, C. ; Campardo, G. ; Vanalli, G.P.

  • Author_Institution
    DEIS, Univ. of Bologna, Bologna
  • fYear
    2008
  • fDate
    25-29 May 2008
  • Firstpage
    165
  • Lastpage
    170
  • Abstract
    We analyze the electrical phenomena that can affect the integrity of the communication among different chips within a system in package (SiP). We address these issues for a real case, for which electrical parameters are extracted from layout and used to build a netlist employed for electrical characterization. We show that crosstalk, and in particular inductive crosstalk, is the electrical phenomenon mainly affecting signal transmission within the SiP. Then, we evaluate the kinds of errors that can be originated. We show that errors caused by inductive coupling among SiP interconnects can be unidirectional only, thus allowing designers to implement error control coding techniques based on all unidirectional error detecting codes. This allows significant cost reduction over the alternate use of non-unidirectional error detecting codes.
  • Keywords
    crosstalk; error correction codes; error detection codes; integrated circuit interconnections; integrated circuit layout; system-in-package; SiP interconnects; circuit layout; cost reduction; electrical characterization; error control coding techniques; inductive coupling; inductive crosstalk; signal integrity; signal transmission; system in package; unidirectional error detecting codes; Costs; Couplings; Crosstalk; Electronics packaging; Error correction codes; Intersymbol interference; Logic; Risk analysis; Signal analysis; System testing; Crosstalk; Error Detecting Codes; Signal Integrity; System in Package;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2008 13th European
  • Conference_Location
    Verbania
  • Print_ISBN
    978-0-7695-3150-2
  • Type

    conf

  • DOI
    10.1109/ETS.2008.23
  • Filename
    4556043