DocumentCode
1998159
Title
Selective Hardening in Early Design Steps
Author
Zoellin, Christian G. ; Wunderlich, Hans-Joachim ; Polian, Ilia ; Becker, Bernd
Author_Institution
Stuttgart Univ., Stuttgart
fYear
2008
fDate
25-29 May 2008
Firstpage
185
Lastpage
190
Abstract
Hardening a circuit against soft errors should be performed in early design steps before the circuit is laid out. A viable approach to achieve soft error rate (SER) reduction at a reasonable cost is to harden only parts of a circuit. When selecting which locations in the circuit to harden, priority should be given to critical spots for which an error is likely to cause a system malfunction. The criticality of the spots depends on parameters not all available in early design steps. We employ a selection strategy which takes only gate-level information into account and does not use any low-level electrical or timing information. We validate the quality of the solution using an accurate SER estimator based on the new UGC particle strike model. Although only partial information is utilized for hardening, the exact validation shows that the susceptibility of a circuit to soft errors is reduced significantly. The results of the hardening strategy presented are also superior to known purely topological strategies in terms of both hardware overhead and protection.
Keywords
circuit reliability; fault tolerance; network synthesis; UGC particle strike model; early design steps; gate-level information; low-level electrical information; selective hardening; soft error rate reduction; timing information; Circuit testing; Costs; Error analysis; Flip-flops; Hardware; Performance evaluation; Protection; Pulse circuits; Timing; User-generated content; Soft error mitigation; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2008 13th European
Conference_Location
Verbania
Print_ISBN
978-0-7695-3150-2
Type
conf
DOI
10.1109/ETS.2008.30
Filename
4556046
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