• DocumentCode
    1998159
  • Title

    Selective Hardening in Early Design Steps

  • Author

    Zoellin, Christian G. ; Wunderlich, Hans-Joachim ; Polian, Ilia ; Becker, Bernd

  • Author_Institution
    Stuttgart Univ., Stuttgart
  • fYear
    2008
  • fDate
    25-29 May 2008
  • Firstpage
    185
  • Lastpage
    190
  • Abstract
    Hardening a circuit against soft errors should be performed in early design steps before the circuit is laid out. A viable approach to achieve soft error rate (SER) reduction at a reasonable cost is to harden only parts of a circuit. When selecting which locations in the circuit to harden, priority should be given to critical spots for which an error is likely to cause a system malfunction. The criticality of the spots depends on parameters not all available in early design steps. We employ a selection strategy which takes only gate-level information into account and does not use any low-level electrical or timing information. We validate the quality of the solution using an accurate SER estimator based on the new UGC particle strike model. Although only partial information is utilized for hardening, the exact validation shows that the susceptibility of a circuit to soft errors is reduced significantly. The results of the hardening strategy presented are also superior to known purely topological strategies in terms of both hardware overhead and protection.
  • Keywords
    circuit reliability; fault tolerance; network synthesis; UGC particle strike model; early design steps; gate-level information; low-level electrical information; selective hardening; soft error rate reduction; timing information; Circuit testing; Costs; Error analysis; Flip-flops; Hardware; Performance evaluation; Protection; Pulse circuits; Timing; User-generated content; Soft error mitigation; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2008 13th European
  • Conference_Location
    Verbania
  • Print_ISBN
    978-0-7695-3150-2
  • Type

    conf

  • DOI
    10.1109/ETS.2008.30
  • Filename
    4556046