Title :
Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom
Author :
Zhao, Chen ; He, Jun ; Lee, Sheng-Huang ; Peterson, Karl ; Geiger, Randall ; Chen, Degang
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A new on-die temperature sensor that operates at low supply voltages and exhibits low process sensitivity and good linearity over a wide temperature range is introduced. When compared to conventional structures which have limited supply voltage headroom at the slow-n process corner, the new structures have sufficient headroom to practically operate well over all process corners. When implemented in a TSMC 0.1 Sum process with a nominal supply voltage of 1.8V, simulation results show the maximum temperature linearity error is reduced from 1.5°C to less than 0.3°C at the NMOS slow process corner and with negative 10% Vdd variation.
Keywords :
CMOS integrated circuits; low-power electronics; temperature sensors; NMOS slow-n process corner; TSMC process; linear Vt-based temperature sensor; low process sensitivity; low supply voltage; maximum temperature linearity error; on-die temperature sensor; power supply headroom; size 0.18 mum; temperature 1.5 degC; voltage 1.8 V; Clocks; Equations; MOS devices; Mathematical model; Temperature sensors; Thermal management; Very large scale integration;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5938125