• DocumentCode
    1998284
  • Title

    Minimizing the bottom reflection in Ultrasonic CMUT Transducer backing using low profile structuring

  • Author

    Chapagain, Kamal Raj ; Rnnekleiv, Arne

  • Author_Institution
    Dept. of Electron. & Telecommun., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    Capacitive Micro-machined Ultrasonic Transducer (CMUT) transducers need an acoustic backing to ensure that any acoustic signal which propagates from the transducer into the substrate is absorbed in the backing. The backing should be made such that it does not give a false echo in the signal received by or transmitted from the transducer. Ideally, this backing material should provide high attenuation and it should match the acoustic impedance of the CMUT supporting structure (usually silicon). To avoid the echoes described above, a thick backing layer is required. But in many cases, there is little space available under the transducer so that it is difficult to accommodate a sufficiently thick layer of material with realistic propagation losses, to ensure that no signal is reflected back to the transducer. In this paper, we discuss irregular structures at the bottom surface that are used to scatter the waves. The proposed structure scatters the waves into waves with significantly changed propagation directions, giving long propagation paths back to the transducer. The structure is analyzed using FEM simulations for a simple 2D case. Different ways of implementing the structure is also discussed.
  • Keywords
    capacitive sensors; finite element analysis; silicon; ultrasonic propagation; ultrasonic reflection; ultrasonic transducers; CMUT supporting structure; FEM simulation; acoustic backing; bottom reflection minimization; capacitive micromachined ultrasonic transducer; finite element method; low profile structuring; thick backing layer; ultrasonic CMUT transducer; Acoustic materials; Acoustic propagation; Acoustic reflection; Acoustic scattering; Acoustic transducers; Attenuation; Impedance; Propagation losses; Silicon; Ultrasonic transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441721
  • Filename
    5441721