• DocumentCode
    1998311
  • Title

    On the imaging of slip boundaries using 3D elastography

  • Author

    Garcia, Leo J. ; Uff, Christopher ; Fromageau, Jérémie ; Bamber, Jeffrey C.

  • Author_Institution
    Joint Dept. of Phys., Inst. of Cancer Res., Sutton, UK
  • fYear
    2009
  • fDate
    20-23 Sept. 2009
  • Firstpage
    2426
  • Lastpage
    2428
  • Abstract
    Slip elastography is a new branch of elastography which incorporates shear strain imaging and force estimation, with a view to detecting and characterizing slip boundaries between tumors and their surroundings. This paper introduces the principles of slip elastography. It is hypothesized that apparent shear strains may arise due to shear motion across a slip boundary. This is investigated through FEM simulation and phantom experiments. It was found that axial shear strain across a tumor boundary is greater when it may slip freely against the surrounding material compared to when it is adhered. Additional indicators of slip motion were found: discontinuous gradients in displacement data at the tumor boundary; high axial strain surrounding the tumor, as a result of high local spatial gradients in displacement at the tumor boundary; inhomogeneous distribution axial strain within the tumor; axial shear strain contrast inside the tumor. In the future, these indicators will be used to help locate slip boundaries in the scan plane.
  • Keywords
    biomedical ultrasonics; finite element analysis; phantoms; tumours; ultrasonic imaging; 3D slip elastography; FEM simulation; axial shear strain; force estimation; local spatial gradient; phantom experiment; scan plane; shear motion; shear strain imaging; slip boundary imaging; tumor boundary; Capacitive sensors; Finite element methods; Imaging phantoms; Least squares approximation; Mathematical model; Neoplasms; Physics; Testing; Ultrasonic imaging; Uniaxial strain; FEM; elastography; shear; slip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2009 IEEE International
  • Conference_Location
    Rome
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4244-4389-5
  • Electronic_ISBN
    1948-5719
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2009.5441722
  • Filename
    5441722